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Division of Instrumental Analysis
Supporting Research on the Synthesis of New Organic Molecules and Nano-Materials with Cutting-Edge Analysis Instruments
    Equipment and Machines
Equipment and Machines
 
 

Scanning Probe Microscopy System (SPM)

 


The SPM system detects the atomic force or the tunnel current between the sample surface and the probe tip, and can result a topographic map when the tip is scanned across the sample surface. SPM can image surfaces with atomic-scale resolution, 0.2 nm in the surface and 0.01 nm to the perpendicular direction of the sample. It is possible to do even the observation of the atomic level imaging under the optimal conditions.

By replacement of the unit, it can have the measurement mode of Atomic Force Microscope (AFM), Scanning Tunneling Microscope (STM), Frictional Force Microscope (FFM), Electrochemical AFM, Viscoelastic AFM (VE-AFM) and so on. Measurement at the temperature from -140 C to 300 C, under vacuum, or in liquid (of a volume of 1<mL) is also available.

The system consists of a probe station for a system control, a data processing system, and two measurement units (a multi function-type unit SPA400 and an environment control-type unit SPA300HV). Most of the measurements, such as AFM, can be performed with either of the two units. However, electrochemical AFM, STM measurements are available only with SPA400, and measurements at controlled temperature / or under vacuum conditions are possible only with SPA300HV. Both of the units are equipped with an optical microscope. With that, it is easy to settle a sample and adjust the instrumental conditions. The data processing system (DELL OptiPlex GXa, DOS/V type, Windows95) provides useful various filters such as Fast Fourier Transform (FFT) algorithm and data analysis programs, and you can make a full color 3-dimensional image and print out it by using an EPSON PM-750C printer.
Measurement Modes
Contact AFM, wet-AFM, AFM with electric current measurement, surface electrical potential microscope, dynamic force mode (FM, cyclic contact mode or non-contact mode AFM), wet-DFM, STM, electrochemical AFM, electrochemical STM, VE-AFM, FFM, lateral modulation (LM)-FFM.
2004.2.9 Back